| Message ID | 1586497552-12194-3-git-send-email-chunfeng.yun@mediatek.com |
|---|---|
| State | Superseded |
| Headers | show |
| Series | Add support for MediaTek xHCI host controller | expand |
On Fri, 2020-04-10 at 13:45 +0800, Chunfeng Yun wrote: > Add a test item for ofnode_get_child_count() > > Signed-off-by: Chunfeng Yun <chunfeng.yun at mediatek.com> > Reviewed-by: Simon Glass <sjg at chromium.org> > --- > v4~v5: no changes > > v3: > 1. squash dts patch into this one suggested by Simon > 2. add reviewed-by Simon > > v2: > a new patch to test ofnode_get_child_count() suggested by Simon > --- > arch/sandbox/dts/test.dts | 18 ++++++++++++++++++ > test/dm/ofnode.c | 21 +++++++++++++++++++++ > 2 files changed, 39 insertions(+) > Reviewed-by: Weijie Gao <weijie.gao at mediatek.com>
diff --git a/arch/sandbox/dts/test.dts b/arch/sandbox/dts/test.dts index 4a277934a7..09e69a9d33 100644 --- a/arch/sandbox/dts/test.dts +++ b/arch/sandbox/dts/test.dts @@ -202,6 +202,24 @@ compatible = "denx,u-boot-fdt-test1"; }; + i-test { + compatible = "mediatek,u-boot-fdt-test"; + #address-cells = <1>; + #size-cells = <0>; + + subnode0 { + reg = <0>; + }; + + subnode1 { + reg = <1>; + }; + + subnode2 { + reg = <2>; + }; + }; + devres-test { compatible = "denx,u-boot-devres-test"; }; diff --git a/test/dm/ofnode.c b/test/dm/ofnode.c index 1c49eaf38b..07d5c7d7a6 100644 --- a/test/dm/ofnode.c +++ b/test/dm/ofnode.c @@ -113,3 +113,24 @@ static int dm_test_ofnode_read_chosen(struct unit_test_state *uts) return 0; } DM_TEST(dm_test_ofnode_read_chosen, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); + +static int dm_test_ofnode_get_child_count(struct unit_test_state *uts) +{ + ofnode node, child_node; + u32 val; + + node = ofnode_path("/i-test"); + ut_assert(ofnode_valid(node)); + + val = ofnode_get_child_count(node); + ut_asserteq(3, val); + + child_node = ofnode_first_subnode(node); + ut_assert(ofnode_valid(child_node)); + val = ofnode_get_child_count(child_node); + ut_asserteq(0, val); + + return 0; +} +DM_TEST(dm_test_ofnode_get_child_count, + DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);