Message ID | 20231120145049.310509-1-m.majewski2@samsung.com |
---|---|
Headers | show |
Series | Improve Exynos thermal driver | expand |
On 11/20/23 14:50, Mateusz Majewski wrote: > Currently, each trip point defined in the device tree corresponds to a > single hardware interrupt. This commit instead switches to using two > hardware interrupts, whose values are set dynamically using the > set_trips callback. Additionally, the critical temperature threshold is > handled specifically. > > Setting interrupts in this way also fixes a long-standing lockdep > warning, which was caused by calling thermal_zone_get_trips with our > lock being held. Do note that this requires TMU initialization to be > split into two parts, as done by the parent commit: parts of the > initialization call into the thermal_zone_device structure and so must > be done after its registration, but the initialization is also > responsible for setting up calibration, which must be done before > thermal_zone_device registration, which will call set_trips for the > first time; if the calibration is not done in time, the interrupt values > will be silently wrong! > > Signed-off-by: Mateusz Majewski <m.majewski2@samsung.com> > --- > v4 -> v5: Simplified Exynos 7 code, used the correct register offsets > for Exynos 7 and refactored some common register-setting code. > v2 -> v3: Fixed formatting of some comments. > v1 -> v2: We take clocks into account; anything that sets temperature > thresholds needs clk. > > drivers/thermal/samsung/exynos_tmu.c | 393 ++++++++++++++------------- > 1 file changed, 209 insertions(+), 184 deletions(-) The code LGTM and I like the idea of dynamically configured IRQs for trips. Reviewed-by: Lukasz Luba <lukasz.luba@arm.com> Regards, Lukasz