@@ -1706,7 +1706,8 @@ static const struct samsung_gate_clock peric_gate_clks[] __initconst = {
GATE(CLK_SCLK_PCM1, "sclk_pcm1", "sclk_pcm1_peric",
ENABLE_SCLK_PERIC, 7, CLK_SET_RATE_PARENT, 0),
GATE(CLK_SCLK_I2S1, "sclk_i2s1", "sclk_i2s1_peric",
- ENABLE_SCLK_PERIC, 6, CLK_SET_RATE_PARENT, 0),
+ ENABLE_SCLK_PERIC, 6,
+ CLK_SET_RATE_PARENT | CLK_IGNORE_UNUSED, 0),
GATE(CLK_SCLK_SPI2, "sclk_spi2", "sclk_spi2_peric", ENABLE_SCLK_PERIC,
5, CLK_SET_RATE_PARENT, 0),
GATE(CLK_SCLK_SPI1, "sclk_spi1", "sclk_spi1_peric", ENABLE_SCLK_PERIC,
Mark the SCLK clock for Exynos5433 I2S1 device with IGNORE_UNUSED flag to match its behaviour with SCLK clock for AUD_I2S (I2S0) device until a proper fix for Exynos I2S driver is ready. This fixes the following synchronous abort issue revealed by the probe order change caused by the commit 93d2e4322aa ("of: platform: Batch fwnode parsing when adding all top level devices"): Internal error: synchronous external abort: 96000210 [#1] PREEMPT SMP Modules linked in: CPU: 0 PID: 50 Comm: kworker/0:1 Not tainted 5.7.0-rc5+ #701 Hardware name: Samsung TM2E board (DT) Workqueue: events deferred_probe_work_func pstate: 60000005 (nZCv daif -PAN -UAO) pc : samsung_i2s_probe+0x768/0x8f0 lr : samsung_i2s_probe+0x688/0x8f0 ... Call trace: samsung_i2s_probe+0x768/0x8f0 platform_drv_probe+0x50/0xa8 really_probe+0x108/0x370 driver_probe_device+0x54/0xb8 __device_attach_driver+0x90/0xc0 bus_for_each_drv+0x70/0xc8 __device_attach+0xdc/0x140 device_initial_probe+0x10/0x18 bus_probe_device+0x94/0xa0 deferred_probe_work_func+0x70/0xa8 process_one_work+0x2a8/0x718 worker_thread+0x48/0x470 kthread+0x134/0x160 ret_from_fork+0x10/0x1c Code: 17ffffaf d503201f f94086c0 91003000 (88dffc00) ---[ end trace ccf721c9400ddbd6 ]--- Signed-off-by: Marek Szyprowski <m.szyprowski@samsung.com> --- drivers/clk/samsung/clk-exynos5433.c | 3 ++- 1 file changed, 2 insertions(+), 1 deletion(-)