@@ -346,6 +346,15 @@ config AB8500_BM
help
Say Y to include support for AB8500 battery management.
+config AB8500_BM_DEEP_DEBUG
+ bool "AB8500 Battery Management Deep Debug"
+ depends on (AB8500_BM && DEEP_DEBUG)
+ default y
+ help
+ Say Y to include support for Deep Debug interface
+ for battery management.
+ If unsure, say N.
+
config CHARGER_PM2301
bool "PM2301 Battery Charger Driver"
depends on AB8500_BM
@@ -356,6 +365,7 @@ config CHARGER_PM2301
config PM2XXX_DEEP_DEBUG
bool "PM2XXX Deep Debug"
depends on DEEP_DEBUG && CHARGER_PM2301
+ default n
help
Deep Debug interface provides an access to all registers.
It allows to read or write directly a register.
@@ -39,6 +39,7 @@ obj-$(CONFIG_BATTERY_JZ4740) += jz4740-battery.o
obj-$(CONFIG_BATTERY_INTEL_MID) += intel_mid_battery.o
obj-$(CONFIG_BATTERY_RX51) += rx51_battery.o
obj-$(CONFIG_AB8500_BM) += ab8500_bmdata.o ab8500_charger.o ab8500_fg.o ab8500_btemp.o abx500_chargalg.o
+obj-$(CONFIG_AB8500_BM_DEEP_DEBUG) += ab8500_fg_deepdebug.o
obj-$(CONFIG_CHARGER_ISP1704) += isp1704_charger.o
obj-$(CONFIG_CHARGER_MAX8903) += max8903_charger.o
obj-$(CONFIG_CHARGER_TWL4030) += twl4030_charger.o
@@ -33,25 +33,12 @@
#include <linux/mfd/abx500/ab8500-bm.h>
#include <linux/mfd/abx500/ab8500-gpadc.h>
#include <linux/kernel.h>
+#include "ab8500_fg.h"
-#define MILLI_TO_MICRO 1000
-#define FG_LSB_IN_MA 1627
-#define QLSB_NANO_AMP_HOURS_X10 1129
-#define INS_CURR_TIMEOUT (3 * HZ)
-
-#define SEC_TO_SAMPLE(S) (S * 4)
-
-#define NBR_AVG_SAMPLES 20
-
-#define LOW_BAT_CHECK_INTERVAL (HZ / 16) /* 62.5 ms */
-
-#define VALID_CAPACITY_SEC (45 * 60) /* 45 minutes */
-#define BATT_OK_MIN 2360 /* mV */
-#define BATT_OK_INCREMENT 50 /* mV */
-#define BATT_OK_MAX_NR_INCREMENTS 0xE
-
-/* FG constants */
-#define BATT_OVV 0x01
+char *charge_state[] = {
+ "CHARGE_INIT",
+ "CHARGE_READOUT",
+};
#define interpolate(x, x1, y1, x2, y2) \
((y1) + ((((y2) - (y1)) * ((x) - (x1))) / ((x2) - (x1))));
@@ -59,186 +46,6 @@
#define to_ab8500_fg_device_info(x) container_of((x), \
struct ab8500_fg, fg_psy);
-/**
- * struct ab8500_fg_interrupts - ab8500 fg interupts
- * @name: name of the interrupt
- * @isr function pointer to the isr
- */
-struct ab8500_fg_interrupts {
- char *name;
- irqreturn_t (*isr)(int irq, void *data);
-};
-
-enum ab8500_fg_discharge_state {
- AB8500_FG_DISCHARGE_INIT,
- AB8500_FG_DISCHARGE_INITMEASURING,
- AB8500_FG_DISCHARGE_INIT_RECOVERY,
- AB8500_FG_DISCHARGE_RECOVERY,
- AB8500_FG_DISCHARGE_READOUT_INIT,
- AB8500_FG_DISCHARGE_READOUT,
- AB8500_FG_DISCHARGE_WAKEUP,
-};
-
-static char *discharge_state[] = {
- "DISCHARGE_INIT",
- "DISCHARGE_INITMEASURING",
- "DISCHARGE_INIT_RECOVERY",
- "DISCHARGE_RECOVERY",
- "DISCHARGE_READOUT_INIT",
- "DISCHARGE_READOUT",
- "DISCHARGE_WAKEUP",
-};
-
-enum ab8500_fg_charge_state {
- AB8500_FG_CHARGE_INIT,
- AB8500_FG_CHARGE_READOUT,
-};
-
-static char *charge_state[] = {
- "CHARGE_INIT",
- "CHARGE_READOUT",
-};
-
-enum ab8500_fg_calibration_state {
- AB8500_FG_CALIB_INIT,
- AB8500_FG_CALIB_WAIT,
- AB8500_FG_CALIB_END,
-};
-
-struct ab8500_fg_avg_cap {
- int avg;
- int samples[NBR_AVG_SAMPLES];
- __kernel_time_t time_stamps[NBR_AVG_SAMPLES];
- int pos;
- int nbr_samples;
- int sum;
-};
-
-struct ab8500_fg_cap_scaling {
- bool enable;
- int cap_to_scale[2];
- int disable_cap_level;
- int scaled_cap;
-};
-
-struct ab8500_fg_battery_capacity {
- int max_mah_design;
- int max_mah;
- int mah;
- int permille;
- int level;
- int prev_mah;
- int prev_percent;
- int prev_level;
- int user_mah;
- struct ab8500_fg_cap_scaling cap_scale;
-};
-
-struct ab8500_fg_flags {
- bool fg_enabled;
- bool conv_done;
- bool charging;
- bool fully_charged;
- bool force_full;
- bool low_bat_delay;
- bool low_bat;
- bool bat_ovv;
- bool batt_unknown;
- bool calibrate;
- bool user_cap;
- bool batt_id_received;
-};
-
-struct inst_curr_result_list {
- struct list_head list;
- int *result;
-};
-
-/**
- * struct ab8500_fg - ab8500 FG device information
- * @dev: Pointer to the structure device
- * @node: a list of AB8500 FGs, hence prepared for reentrance
- * @irq holds the CCEOC interrupt number
- * @vbat: Battery voltage in mV
- * @vbat_nom: Nominal battery voltage in mV
- * @inst_curr: Instantenous battery current in mA
- * @avg_curr: Average battery current in mA
- * @bat_temp battery temperature
- * @fg_samples: Number of samples used in the FG accumulation
- * @accu_charge: Accumulated charge from the last conversion
- * @recovery_cnt: Counter for recovery mode
- * @high_curr_cnt: Counter for high current mode
- * @init_cnt: Counter for init mode
- * @low_bat_cnt Counter for number of consecutive low battery measures
- * @nbr_cceoc_irq_cnt Counter for number of CCEOC irqs received since enabled
- * @recovery_needed: Indicate if recovery is needed
- * @high_curr_mode: Indicate if we're in high current mode
- * @init_capacity: Indicate if initial capacity measuring should be done
- * @turn_off_fg: True if fg was off before current measurement
- * @calib_state State during offset calibration
- * @discharge_state: Current discharge state
- * @charge_state: Current charge state
- * @ab8500_fg_started Completion struct used for the instant current start
- * @ab8500_fg_complete Completion struct used for the instant current reading
- * @flags: Structure for information about events triggered
- * @bat_cap: Structure for battery capacity specific parameters
- * @avg_cap: Average capacity filter
- * @parent: Pointer to the struct ab8500
- * @gpadc: Pointer to the struct gpadc
- * @bm: Platform specific battery management information
- * @fg_psy: Structure that holds the FG specific battery properties
- * @fg_wq: Work queue for running the FG algorithm
- * @fg_periodic_work: Work to run the FG algorithm periodically
- * @fg_low_bat_work: Work to check low bat condition
- * @fg_reinit_work Work used to reset and reinitialise the FG algorithm
- * @fg_work: Work to run the FG algorithm instantly
- * @fg_acc_cur_work: Work to read the FG accumulator
- * @fg_check_hw_failure_work: Work for checking HW state
- * @cc_lock: Mutex for locking the CC
- * @fg_kobject: Structure of type kobject
- */
-struct ab8500_fg {
- struct device *dev;
- struct list_head node;
- int irq;
- int vbat;
- int vbat_nom;
- int inst_curr;
- int avg_curr;
- int bat_temp;
- int fg_samples;
- int accu_charge;
- int recovery_cnt;
- int high_curr_cnt;
- int init_cnt;
- int low_bat_cnt;
- int nbr_cceoc_irq_cnt;
- bool recovery_needed;
- bool high_curr_mode;
- bool init_capacity;
- bool turn_off_fg;
- enum ab8500_fg_calibration_state calib_state;
- enum ab8500_fg_discharge_state discharge_state;
- enum ab8500_fg_charge_state charge_state;
- struct completion ab8500_fg_started;
- struct completion ab8500_fg_complete;
- struct ab8500_fg_flags flags;
- struct ab8500_fg_battery_capacity bat_cap;
- struct ab8500_fg_avg_cap avg_cap;
- struct ab8500 *parent;
- struct ab8500_gpadc *gpadc;
- struct abx500_bm_data *bm;
- struct power_supply fg_psy;
- struct workqueue_struct *fg_wq;
- struct delayed_work fg_periodic_work;
- struct delayed_work fg_low_bat_work;
- struct delayed_work fg_reinit_work;
- struct work_struct fg_work;
- struct work_struct fg_acc_cur_work;
- struct delayed_work fg_check_hw_failure_work;
- struct mutex cc_lock;
- struct kobject fg_kobject;
-};
static LIST_HEAD(ab8500_fg_list);
/**
@@ -470,7 +277,7 @@ static void ab8500_fg_fill_cap_sample(struct ab8500_fg *di, int sample)
* Enable/Disable coulomb counter.
* On failure returns negative value.
*/
-static int ab8500_fg_coulomb_counter(struct ab8500_fg *di, bool enable)
+int ab8500_fg_coulomb_counter(struct ab8500_fg *di, bool enable)
{
int ret = 0;
mutex_lock(&di->cc_lock);
@@ -483,11 +290,13 @@ static int ab8500_fg_coulomb_counter(struct ab8500_fg *di, bool enable)
goto cc_err;
/* Program the samples */
- ret = abx500_set_register_interruptible(di->dev,
- AB8500_GAS_GAUGE, AB8500_GASG_CC_NCOV_ACCU,
- di->fg_samples);
- if (ret)
- goto cc_err;
+ if (!di->test.enable) {
+ ret = abx500_set_register_interruptible(di->dev,
+ AB8500_GAS_GAUGE, AB8500_GASG_CC_NCOV_ACCU,
+ di->fg_samples);
+ if (ret)
+ goto cc_err;
+ }
/* Start the CC */
ret = abx500_set_register_interruptible(di->dev, AB8500_RTC,
@@ -1403,7 +1212,7 @@ static void ab8500_fg_check_capacity_limits(struct ab8500_fg *di, bool init)
}
}
-static void ab8500_fg_charge_state_to(struct ab8500_fg *di,
+void ab8500_fg_charge_state_to(struct ab8500_fg *di,
enum ab8500_fg_charge_state new_state)
{
dev_dbg(di->dev, "Charge state from %d [%s] to %d [%s]\n",
@@ -1991,12 +1800,17 @@ static void ab8500_fg_instant_work(struct work_struct *work)
static irqreturn_t ab8500_fg_cc_data_end_handler(int irq, void *_di)
{
struct ab8500_fg *di = _di;
- if (!di->nbr_cceoc_irq_cnt) {
- di->nbr_cceoc_irq_cnt++;
- complete(&di->ab8500_fg_started);
- } else {
- di->nbr_cceoc_irq_cnt = 0;
- complete(&di->ab8500_fg_complete);
+
+ if (di->test.enable)
+ complete(&di->test.cceoc_complete);
+ else {
+ if (!di->nbr_cceoc_irq_cnt) {
+ di->nbr_cceoc_irq_cnt++;
+ complete(&di->ab8500_fg_started);
+ } else {
+ di->nbr_cceoc_irq_cnt = 0;
+ complete(&di->ab8500_fg_complete);
+ }
}
return IRQ_HANDLED;
}
@@ -2011,8 +1825,31 @@ static irqreturn_t ab8500_fg_cc_data_end_handler(int irq, void *_di)
static irqreturn_t ab8500_fg_cc_int_calib_handler(int irq, void *_di)
{
struct ab8500_fg *di = _di;
- di->calib_state = AB8500_FG_CALIB_END;
- queue_delayed_work(di->fg_wq, &di->fg_periodic_work, 0);
+
+ if (di->test.enable) {
+ complete(&di->test.cc_int_calib_complete);
+ } else {
+ di->calib_state = AB8500_FG_CALIB_END;
+ queue_delayed_work(di->fg_wq, &di->fg_periodic_work, 0);
+ }
+ return IRQ_HANDLED;
+}
+
+/**
+ * ab8500_fg_cceoc_handler() - end of conversion isr.
+ * @irq: interrupt number
+ * @_di: pointer to the ab8500_fg structure
+ *
+ * Returns IRQ status(IRQ_HANDLED)
+ */
+
+static irqreturn_t ab8500_fg_cceoc_handler(int irq, void *_di)
+{
+ struct ab8500_fg *di = _di;
+
+ if (di->test.enable)
+ complete(&di->test.cceoc_complete);
+
return IRQ_HANDLED;
}
@@ -2027,7 +1864,10 @@ static irqreturn_t ab8500_fg_cc_convend_handler(int irq, void *_di)
{
struct ab8500_fg *di = _di;
- queue_work(di->fg_wq, &di->fg_acc_cur_work);
+ if (di->test.enable)
+ complete(&di->test.nconv_accu_complete);
+ else
+ queue_work(di->fg_wq, &di->fg_acc_cur_work);
return IRQ_HANDLED;
}
@@ -2613,6 +2453,7 @@ static struct ab8500_fg_interrupts ab8500_fg_irq[] = {
{"LOW_BAT_F", ab8500_fg_lowbatf_handler},
{"CC_INT_CALIB", ab8500_fg_cc_int_calib_handler},
{"CCEOC", ab8500_fg_cc_data_end_handler},
+ {"CCEOC", ab8500_fg_cceoc_handler},
};
static char *supply_interface[] = {
@@ -2676,6 +2517,8 @@ static int ab8500_fg_probe(struct platform_device *pdev)
ab8500_fg_charge_state_to(di, AB8500_FG_CHARGE_INIT);
ab8500_fg_discharge_state_to(di, AB8500_FG_DISCHARGE_INIT);
+ ab8500_fg_test_init(di);
+
/* Create a work queue for running the FG algorithm */
di->fg_wq = create_singlethread_workqueue("ab8500_fg_wq");
if (di->fg_wq == NULL) {
new file mode 100644
@@ -0,0 +1,242 @@
+/*
+ * Copyright (C) ST-Ericsson AB 2012
+ *
+ * Main and Back-up battery management driver.
+ *
+ * Note: Backup battery management is required in case of Li-Ion battery and not
+ * for capacitive battery. HREF boards have capacitive battery and hence backup
+ * battery management is not used and the supported code is available in this
+ * driver.
+ *
+ * License Terms: GNU General Public License v2
+ * Author: Johan Palsson <johan.palsson@stericsson.com>
+ * Author: Karl Komierowski <karl.komierowski@stericsson.com>
+ */
+
+#define MILLI_TO_MICRO 1000
+#define FG_LSB_IN_MA 1627
+#define QLSB_NANO_AMP_HOURS_X10 1129
+#define INS_CURR_TIMEOUT (3 * HZ)
+
+#define SEC_TO_SAMPLE(S) (S * 4)
+
+#define NBR_AVG_SAMPLES 20
+
+#define LOW_BAT_CHECK_INTERVAL (HZ / 16) /* 62.5 ms */
+
+#define VALID_CAPACITY_SEC (45 * 60) /* 45 minutes */
+#define BATT_OK_MIN 2360 /* mV */
+#define BATT_OK_INCREMENT 50 /* mV */
+#define BATT_OK_MAX_NR_INCREMENTS 0xE
+
+/* FG constants */
+#define BATT_OVV 0x01
+
+/**
+ * struct ab8500_fg_interrupts - ab8500 fg interupts
+ * @name: name of the interrupt
+ * @isr function pointer to the isr
+ */
+struct ab8500_fg_interrupts {
+ char *name;
+ irqreturn_t (*isr)(int irq, void *data);
+};
+
+enum ab8500_fg_discharge_state {
+ AB8500_FG_DISCHARGE_INIT,
+ AB8500_FG_DISCHARGE_INITMEASURING,
+ AB8500_FG_DISCHARGE_INIT_RECOVERY,
+ AB8500_FG_DISCHARGE_RECOVERY,
+ AB8500_FG_DISCHARGE_READOUT_INIT,
+ AB8500_FG_DISCHARGE_READOUT,
+ AB8500_FG_DISCHARGE_WAKEUP,
+};
+
+enum ab8500_fg_charge_state {
+ AB8500_FG_CHARGE_INIT,
+ AB8500_FG_CHARGE_READOUT,
+};
+
+enum ab8500_fg_calibration_state {
+ AB8500_FG_CALIB_INIT,
+ AB8500_FG_CALIB_WAIT,
+ AB8500_FG_CALIB_END,
+};
+
+struct ab8500_fg_avg_cap {
+ int avg;
+ int samples[NBR_AVG_SAMPLES];
+ __kernel_time_t time_stamps[NBR_AVG_SAMPLES];
+ int pos;
+ int nbr_samples;
+ int sum;
+};
+
+struct ab8500_fg_cap_scaling {
+ bool enable;
+ int cap_to_scale[2];
+ int disable_cap_level;
+ int scaled_cap;
+};
+
+struct ab8500_fg_battery_capacity {
+ int max_mah_design;
+ int max_mah;
+ int mah;
+ int permille;
+ int level;
+ int prev_mah;
+ int prev_percent;
+ int prev_level;
+ int user_mah;
+ struct ab8500_fg_cap_scaling cap_scale;
+};
+
+struct ab8500_fg_flags {
+ bool fg_enabled;
+ bool conv_done;
+ bool charging;
+ bool fully_charged;
+ bool force_full;
+ bool low_bat_delay;
+ bool low_bat;
+ bool bat_ovv;
+ bool batt_unknown;
+ bool calibrate;
+ bool user_cap;
+ bool batt_id_received;
+};
+
+struct inst_curr_result_list {
+ struct list_head list;
+ int *result;
+};
+
+/**
+ * struct ab8500_fg_test - ab8500 FG device information in test mode
+ * @enable: true if fg in test mode else false
+ * @cc_int_offset: offset for internal calibration
+ * @cc_soft_offset: offset for software calibration
+ * @cc_sample_conv: sample read
+ * @cc_sample_conv_calib_uA: sample converted in uA
+ * @cceoc_complete: pointer to the struct completion, to indicate
+ * the completion of internal calibration and
+ * one sample reading
+ * @nconv_accu_complete: pointer to the struct completion, to indicate
+ * the completion of sample to accumulate
+ * @cc_int_calib_complete: pointer to the struct completion, to indicate
+ * the completion of internal calibration
+ * @lock: Mutex for locking the CC
+ */
+struct ab8500_fg_test {
+ bool enable;
+ u8 cc_int_offset;
+ u8 cc_soft_offset;
+ u16 cc_sample_conv;
+ int cc_sample_conv_calib_uA;
+ struct completion cceoc_complete;
+ struct completion nconv_accu_complete;
+ struct completion cc_int_calib_complete;
+ struct mutex lock;
+};
+
+/**
+ * struct ab8500_fg - ab8500 FG device information
+ * @dev: Pointer to the structure device
+ * @node: a list of AB8500 FGs, hence prepared for reentrance
+ * @irq holds the CCEOC interrupt number
+ * @vbat: Battery voltage in mV
+ * @vbat_nom: Nominal battery voltage in mV
+ * @inst_curr: Instantenous battery current in mA
+ * @avg_curr: Average battery current in mA
+ * @bat_temp battery temperature
+ * @fg_samples: Number of samples used in the FG accumulation
+ * @accu_charge: Accumulated charge from the last conversion
+ * @recovery_cnt: Counter for recovery mode
+ * @high_curr_cnt: Counter for high current mode
+ * @init_cnt: Counter for init mode
+ * @low_bat_cnt Counter for number of consecutive low battery measures
+ * @nbr_cceoc_irq_cnt Counter for number of CCEOC irqs received since enabled
+ * @recovery_needed: Indicate if recovery is needed
+ * @high_curr_mode: Indicate if we're in high current mode
+ * @init_capacity: Indicate if initial capacity measuring should be done
+ * @turn_off_fg: True if fg was off before current measurement
+ * @calib_state State during offset calibration
+ * @discharge_state: Current discharge state
+ * @charge_state: Current charge state
+ * @ab8500_fg_started Completion struct used for the instant current start
+ * @ab8500_fg_complete Completion struct used for the instant current reading
+ * @flags: Structure for information about events triggered
+ * @bat_cap: Structure for battery capacity specific parameters
+ * @avg_cap: Average capacity filter
+ * @parent: Pointer to the struct ab8500
+ * @gpadc: Pointer to the struct gpadc
+ * @bm: Platform specific battery management information
+ * @fg_psy: Structure that holds the FG specific battery properties
+ * @fg_wq: Work queue for running the FG algorithm
+ * @fg_periodic_work: Work to run the FG algorithm periodically
+ * @fg_low_bat_work: Work to check low bat condition
+ * @fg_reinit_work Work used to reset and reinitialise the FG algorithm
+ * @fg_work: Work to run the FG algorithm instantly
+ * @fg_acc_cur_work: Work to read the FG accumulator
+ * @fg_check_hw_failure_work: Work for checking HW state
+ * @cc_lock: Mutex for locking the CC
+ * @fg_kobject: Structure of type kobject
+ */
+struct ab8500_fg {
+ struct device *dev;
+ struct list_head node;
+ int irq;
+ int vbat;
+ int vbat_nom;
+ int inst_curr;
+ int avg_curr;
+ int bat_temp;
+ int fg_samples;
+ int accu_charge;
+ int recovery_cnt;
+ int high_curr_cnt;
+ int init_cnt;
+ int low_bat_cnt;
+ int nbr_cceoc_irq_cnt;
+ bool recovery_needed;
+ bool high_curr_mode;
+ bool init_capacity;
+ bool turn_off_fg;
+ enum ab8500_fg_calibration_state calib_state;
+ enum ab8500_fg_discharge_state discharge_state;
+ enum ab8500_fg_charge_state charge_state;
+ struct completion ab8500_fg_started;
+ struct completion ab8500_fg_complete;
+ struct ab8500_fg_flags flags;
+ struct ab8500_fg_battery_capacity bat_cap;
+ struct ab8500_fg_avg_cap avg_cap;
+ struct ab8500 *parent;
+ struct ab8500_gpadc *gpadc;
+ struct abx500_bm_data *bm;
+ struct power_supply fg_psy;
+ struct workqueue_struct *fg_wq;
+ struct delayed_work fg_periodic_work;
+ struct delayed_work fg_low_bat_work;
+ struct delayed_work fg_reinit_work;
+ struct work_struct fg_work;
+ struct work_struct fg_acc_cur_work;
+ struct delayed_work fg_check_hw_failure_work;
+ struct mutex cc_lock;
+ struct kobject fg_kobject;
+};
+
+extern char *discharge_state[];
+extern char *charge_state[];
+
+int ab8500_fg_coulomb_counter(struct ab8500_fg *di, bool enable);
+void ab8500_fg_charge_state_to(struct ab8500_fg *di,
+ enum ab8500_fg_charge_state new_state);
+void ab8500_fg_discharge_state_to(struct ab8500_fg *di,
+ enum ab8500_fg_charge_state new_state);
+/* test initialization */
+#ifdef CONFIG_AB8500_BM_DEEP_DEBUG
+void ab8500_fg_test_init(struct ab8500_fg *di);
+#else
+void ab8500_fg_test_init(struct ab8500_fg *di) {return; }
+#endif
new file mode 100644
@@ -0,0 +1,823 @@
+/*
+ * Copyright (C) ST-Ericsson AB 2012
+ *
+ * Battery Management Deep debug support
+ *
+ * Note: Deep debug features are needed to perform the
+ * HW validation of the platform
+ *
+ * License Terms: GNU General Public License v2
+ * Author: Cedric Madianga <cedric.madianga@stericsson.com>
+ */
+
+#include <linux/init.h>
+#include <linux/interrupt.h>
+#include <linux/power_supply.h>
+#include <linux/mfd/ab8500.h>
+#include <linux/mfd/abx500.h>
+#include <linux/mfd/abx500/ab8500-bm.h>
+#include <linux/delay.h>
+#include <linux/time.h>
+
+#include "ab8500_fg.h"
+
+/* Exposure to the debugfs interface for test purpose only */
+
+/**
+ * ab8500_fg_test_algorithm_en() - enable or disable gas gauge test mode
+ * @di: pointer to the ab8500_fg structure
+ * @enable: enable/disable gas gaude test mode
+ *
+ * Return 0 or error code
+ * Only used for test purpose
+ */
+int ab8500_fg_test_algorithm_en(struct ab8500_fg *di, bool enable)
+{
+ int ret = 0;
+
+ if (enable) {
+ /* Set coulomb counter in test mode. */
+ dev_dbg(di->dev, "Try to put gas gauge in test mode\n");
+ cancel_delayed_work_sync(&di->fg_periodic_work);
+ if (di->flags.fg_enabled) {
+ ret = ab8500_fg_coulomb_counter(di, false);
+ if (ret)
+ return ret;
+ }
+ di->test.enable = true;
+ dev_dbg(di->dev, "Gas gauge in test mode\n");
+ } else {
+ /* Set coulomb counter in normal mode. */
+ dev_dbg(di->dev, "Try to put gas gauge in normal mode\n");
+ if (di->flags.fg_enabled) {
+ ret = ab8500_fg_coulomb_counter(di, false);
+ if (ret)
+ return ret;
+ }
+
+ di->init_capacity = true;
+ ab8500_fg_charge_state_to(di, AB8500_FG_CHARGE_INIT);
+ ab8500_fg_discharge_state_to(di, AB8500_FG_DISCHARGE_INIT);
+
+ di->flags.batt_unknown = true;
+ di->flags.batt_id_received = false;
+
+ di->test.enable = false;
+ ab8500_fg_coulomb_counter(di, true);
+
+ di->flags.calibrate = true;
+ di->calib_state = AB8500_FG_CALIB_INIT;
+ dev_dbg(di->dev, "Gas gauge in normal mode\n");
+ }
+
+ return ret;
+}
+
+/**
+ * ab8500_fg_is_test_is_algorithm_en() -
+ * Return 1 if fg algorithm is enable 0 else
+ * @di: pointer to the ab8500_fg structure
+ *
+ * Only used for test purpose
+ */
+bool ab8500_fg_test_is_algorithm_en(struct ab8500_fg *di)
+{
+ return di->test.enable;
+}
+
+/**
+ * ab8500_fg_test_en() - enable coulomb counter
+ * @di: pointer to the ab8500_fg structure
+ * @enable: enable/disable
+ *
+ * Return 0 or error code on failure
+ * Only used for test purpose
+ */
+
+int ab8500_fg_test_en(struct ab8500_fg *di, bool enable)
+{
+ return ab8500_fg_coulomb_counter(di, enable);
+}
+
+/**
+ * ab8500_fg_test_is_en() - Return 1 if fg is enabled 0 else
+ * @di: pointer to the ab8500_fg structure
+ *
+ * Only used for test purpose
+ */
+bool ab8500_fg_test_is_en(struct ab8500_fg *di)
+{
+ return di->flags.fg_enabled;
+}
+
+/**
+ * ab8500_fg_test_set_cc_int_n_avg() - set number of conversion to average for
+ * internal calibration
+ * @di: pointer to the ab8500_fg structure
+ * @val: number of conversion to average
+ *
+ * Return 0 or error code on failure
+ * Only used for test purpose
+ */
+int ab8500_fg_test_set_cc_int_n_avg(struct ab8500_fg *di, u8 val)
+{
+ int ret;
+ u8 cc_int_n_avg = 0;
+
+ switch (val) {
+ case 4:
+ cc_int_n_avg = CC_INT_CAL_SAMPLES_4;
+ break;
+ case 8:
+ cc_int_n_avg = CC_INT_CAL_SAMPLES_8;
+ break;
+ case 16:
+ cc_int_n_avg = CC_INT_CAL_SAMPLES_16;
+ break;
+ default:
+ dev_err(di->dev,
+ "incorrect sample values\n"
+ "correct sample values should be 4, 8 or 16\n");
+ }
+
+ ret = abx500_mask_and_set_register_interruptible(di->dev,
+ AB8500_GAS_GAUGE, AB8500_GASG_CC_CTRL_REG,
+ CC_INT_CAL_N_AVG_MASK, cc_int_n_avg);
+ if (ret < 0)
+ dev_err(di->dev,
+ "set number of conversion to average failed\n");
+
+ return ret;
+}
+
+/**
+ * ab8500_fg_test_get_cc_int_n_avg() - get number of conversion to average for
+ * internal calibration
+ * @di: pointer to the ab8500_fg structure
+ *
+ * Return number of conversion to average or error code on failure
+ * Only used for test purpose
+ */
+int ab8500_fg_test_get_cc_int_n_avg(struct ab8500_fg *di)
+{
+ int ret;
+ u8 val = 0;
+
+ ret = abx500_get_register_interruptible(di->dev, AB8500_GAS_GAUGE,
+ AB8500_GASG_CC_CTRL_REG, &val);
+ if (ret < 0) {
+ dev_err(di->dev,
+ "get number of conversion to average failed\n");
+ return ret;
+ }
+
+ switch (val & CC_INT_CAL_N_AVG_MASK) {
+ case CC_INT_CAL_SAMPLES_4:
+ ret = 4;
+ break;
+ case CC_INT_CAL_SAMPLES_8:
+ ret = 8;
+ break;
+ case CC_INT_CAL_SAMPLES_16:
+ ret = 16;
+ break;
+ case CC_INT_CAL_N_AVG_MASK:
+ ret = 16;
+ break;
+ default:
+ dev_err(di->dev,
+ "incorrect val read in AB8500_GASG_CC_CTRL_REG");
+ ret = -EINVAL;
+ break;
+ }
+
+ return ret;
+}
+
+/**
+ * ab8500_fg_test_int_calib() - launch internal calibration
+ * @di: pointer to the ab8500_fg structure
+ *
+ * Return result of calibration or error code on failure
+ * Only used for test purpose
+ */
+int ab8500_fg_test_int_calib(struct ab8500_fg *di)
+{
+ int ret;
+ u8 val;
+
+ mutex_lock(&di->test.lock);
+ dev_dbg(di->dev, "Internal calibration ongoing...\n");
+
+ ret = abx500_mask_and_set_register_interruptible(di->dev,
+ AB8500_GAS_GAUGE, AB8500_GASG_CC_CTRL_REG,
+ CC_INTAVGOFFSET_ENA, CC_INTAVGOFFSET_ENA);
+ if (ret < 0) {
+ dev_err(di->dev,
+ "enabling offset average computation failed\n");
+ goto err;
+ }
+
+ /* wait for completion of calibration */
+ if (!wait_for_completion_timeout(&di->test.cc_int_calib_complete,
+ 5*HZ)) {
+ dev_err(di->dev,
+ "timeout: didn't receive CCIntCalib interrupt\n");
+ ret = -EINVAL;
+ goto err;
+ }
+
+ ret = abx500_get_register_interruptible(di->dev, AB8500_GAS_GAUGE,
+ AB8500_GASG_CC_CNTR_AVGOFF_REG, &val);
+ if (ret < 0)
+ goto err;
+
+ di->test.cc_int_offset = val;
+ dev_dbg(di->dev, "Internal Calibration done...\n");
+ mutex_unlock(&di->test.lock);
+
+ return di->test.cc_int_offset;
+
+err:
+ mutex_unlock(&di->test.lock);
+ dev_err(di->dev, "Internal calibration failure\n");
+ return ret;
+}
+
+/**
+ * ab8500_fg_test_soft_calib() - launch software calibration
+ * @di: pointer to the ab8500_fg structure
+ *
+ * Return result of calibration or error code on failure
+ * Only used for test purpose
+ */
+int ab8500_fg_test_soft_calib(struct ab8500_fg *di)
+{
+ int ret;
+ u8 low_data, high_data;
+
+ mutex_lock(&di->test.lock);
+ dev_dbg(di->dev, "Software calibration ongoing...\n");
+
+ /* Set ADconverter in calibration mode */
+ ret = abx500_mask_and_set_register_interruptible(di->dev,
+ AB8500_GAS_GAUGE, AB8500_GASG_CC_CTRL_REG,
+ CC_CALIB, CC_CALIB);
+ if (ret < 0) {
+ dev_err(di->dev,
+ "set ADconverter in calibration mode failed\n");
+ goto err;
+ }
+
+ /* wait for completion of calibration */
+ if (!wait_for_completion_timeout(&di->test.cceoc_complete, 1*HZ)) {
+ dev_err(di->dev,
+ "timeout: didn't receive CCEOC interrupt\n");
+ ret = -EINVAL;
+ goto err;
+ }
+
+ if (!wait_for_completion_timeout(&di->test.cceoc_complete, 1*HZ)) {
+ dev_err(di->dev,
+ "timeout: didn't receive CCEOC interrupt\n");
+ ret = -EINVAL;
+ goto err;
+ }
+
+ /* Don't set ADConverter in calibration mode */
+ ret = abx500_mask_and_set_register_interruptible(di->dev,
+ AB8500_GAS_GAUGE, AB8500_GASG_CC_CTRL_REG,
+ CC_CALIB, 0x00);
+ if (ret < 0) {
+ dev_err(di->dev, "stopping calibration mode failed\n");
+ goto err;
+ }
+
+ /* Transfer sample and accumulator values */
+ ret = abx500_mask_and_set_register_interruptible(di->dev,
+ AB8500_GAS_GAUGE, AB8500_GASG_CC_CTRL_REG,
+ READ_REQ, READ_REQ);
+ if (ret < 0) {
+ dev_err(di->dev, "transfer accumulator data failed\n");
+ goto err;
+ }
+
+ /* Retrieve sample conversion */
+ ret = abx500_get_register_interruptible(di->dev, AB8500_GAS_GAUGE,
+ AB8500_GASG_CC_SMPL_CNVL_REG, &low_data);
+ if (ret < 0) {
+ dev_err(di->dev, "read low byte sample conversion failed\n");
+ goto err;
+ }
+
+ ret = abx500_get_register_interruptible(di->dev, AB8500_GAS_GAUGE,
+ AB8500_GASG_CC_SMPL_CNVH_REG, &high_data);
+ if (ret < 0) {
+ dev_err(di->dev, "read high byte sample conversion failed\n");
+ goto err;
+ }
+
+ di->test.cc_soft_offset = (high_data << 8) | low_data;
+ dev_dbg(di->dev, "Software Calibration done...\n");
+ mutex_unlock(&di->test.lock);
+
+ return di->test.cc_soft_offset;
+
+err:
+ mutex_unlock(&di->test.lock);
+ dev_err(di->dev, "Software calibration failure\n");
+ return ret;
+}
+
+/**
+ * ab8500_fg_test_set_cc_soft_offset() - set software offset into register
+ * @di: pointer to the ab8500_fg structure
+ * @enable: manual offset to be stored
+ *
+ * Return 0 or error code on failure
+ * Only used for test purpose
+ */
+int ab8500_fg_test_set_cc_soft_offset(struct ab8500_fg *di, u8 val)
+{
+ int ret;
+
+ ret = abx500_set_register_interruptible(di->dev, AB8500_GAS_GAUGE,
+ AB8500_GASG_CC_OFFSET_REG, val);
+ if (ret < 0)
+ dev_err(di->dev,
+ "set software offset failed\n");
+ else
+ di->test.cc_soft_offset = val;
+ return ret;
+}
+
+/**
+ * ab8500_fg_test_get_cc_soft_offset() - get software offset into register
+ * @di: pointer to the ab8500_fg structure
+ * @enable: manual offset to be stored
+ *
+ * Return software offset or error code on failure
+ * Only used for test purpose
+ */
+int ab8500_fg_test_get_cc_soft_offset(struct ab8500_fg *di, u8 *val)
+{
+ int ret;
+
+ ret = abx500_get_register_interruptible(di->dev, AB8500_GAS_GAUGE,
+ AB8500_GASG_CC_OFFSET_REG, val);
+ if (ret < 0)
+ dev_err(di->dev,
+ "get software offset failed\n");
+ else
+ di->test.cc_soft_offset = *val;
+
+ return ret;
+}
+
+/**
+ * ab8500_fg_test_set_rst_accu_sample_counter() - set reset accumulator
+ * sample counter bit
+ * @di: pointer to the ab8500_fg structure
+ * @enable: enable/disable reset acc
+ *
+ * Return 0 or error code on failure
+ * Only used for test purpose
+ */
+int ab8500_fg_test_set_rst_accu_sample_counter(struct ab8500_fg *di,
+ bool enable)
+{
+ int ret;
+ u8 val = 0;
+
+ if (enable)
+ val = RESET_ACCU;
+ ret = abx500_mask_and_set_register_interruptible(di->dev,
+ AB8500_GAS_GAUGE, AB8500_GASG_CC_CTRL_REG,
+ RESET_ACCU, val);
+ if (ret < 0)
+ dev_err(di->dev,
+ "set accumulator sample counter reset bit failed\n");
+
+
+ return ret;
+}
+
+/**
+ * ab8500_fg_test_get_rst_accu_sample_counter() - get reset accumulator
+ * sample counter bit
+ * @di: pointer to the ab8500_fg structure
+ *
+ * Return reset accumulator sample counter bit or error code
+ * Only used for test purpose
+ */
+int ab8500_fg_test_get_rst_accu_sample_counter(struct ab8500_fg *di)
+{
+ u8 val = 0;
+ int ret;
+
+ ret = abx500_get_register_interruptible(di->dev, AB8500_GAS_GAUGE,
+ AB8500_GASG_CC_CTRL_REG, &val);
+ if (ret < 0) {
+ dev_err(di->dev,
+ "get accumulator sample counter reset bit failed\n");
+ return ret;
+ }
+
+ if (val & RESET_ACCU)
+ ret = 1;
+ else
+ ret = 0;
+ return ret;
+}
+
+/**
+ * ab8500_fg_test_set_cc_mux_offset() - set coumlomb counter offset
+ * @di: pointer to the ab8500_fg structure
+ * @enable: enable/disable offset
+ *
+ * Return 0 or error code on failure
+ * Only used for test purpose
+ */
+int ab8500_fg_test_set_cc_mux_offset(struct ab8500_fg *di, bool enable)
+{
+ int ret;
+ u8 val = 0;
+
+ if (enable)
+ val = CC_MUXOFFSET;
+ ret = abx500_mask_and_set_register_interruptible(di->dev,
+ AB8500_GAS_GAUGE, AB8500_GASG_CC_CTRL_REG,
+ CC_MUXOFFSET, val);
+ if (ret < 0)
+ dev_err(di->dev,
+ "set mux offset failed\n");
+
+ return ret;
+}
+
+/**
+ * ab8500_fg_test_get_cc_mux_offset() - get coulomb counter mux offset
+ * @di: pointer to the ab8500_fg structure
+ *
+ * Get mux offset or error code on failure
+ * Only used for test purpose
+ */
+int ab8500_fg_test_get_cc_mux_offset(struct ab8500_fg *di)
+{
+ u8 val = 0;
+ int ret;
+
+ ret = abx500_get_register_interruptible(di->dev, AB8500_GAS_GAUGE,
+ AB8500_GASG_CC_CTRL_REG, &val);
+ if (ret < 0) {
+ dev_err(di->dev,
+ "get mux offset failed\n");
+ return ret;
+ }
+
+ if (val & CC_MUXOFFSET)
+ ret = 1;
+ else
+ ret = 0;
+ return ret;
+}
+
+/**
+ * ab8500_fg_test_read_sample() - read one sample
+ * @di: pointer to the ab8500_fg structure
+ *
+ * Return sample or error code on failure
+ * Only used for test purpose
+ */
+int ab8500_fg_test_read_sample(struct ab8500_fg *di)
+{
+ int ret;
+ u8 low_data, high_data;
+
+ mutex_lock(&di->test.lock);
+ dev_dbg(di->dev, "Sample reading ongoing...\n");
+
+ /* wait for completion of calibration */
+ if (!wait_for_completion_timeout(&di->test.cceoc_complete, 1*HZ)) {
+ dev_err(di->dev,
+ "timeout: didn't receive CCEOC interrupt\n");
+ ret = -EINVAL;
+ goto err;
+ }
+
+ if (!wait_for_completion_timeout(&di->test.cceoc_complete, 1*HZ)) {
+ dev_err(di->dev,
+ "timeout: didn't receive CCEOC interrupt\n");
+ ret = -EINVAL;
+ goto err;
+ }
+
+ /* Transfer sample and accumulator values */
+ ret = abx500_mask_and_set_register_interruptible(di->dev,
+ AB8500_GAS_GAUGE, AB8500_GASG_CC_CTRL_REG,
+ READ_REQ, READ_REQ);
+ if (ret < 0) {
+ dev_err(di->dev, "transfer accumulator data failed\n");
+ goto err;
+ }
+
+ /* Retrieve sample conversion */
+ ret = abx500_get_register_interruptible(di->dev, AB8500_GAS_GAUGE,
+ AB8500_GASG_CC_SMPL_CNVL_REG, &low_data);
+ if (ret < 0) {
+ dev_err(di->dev, "read low byte sample conversion failed\n");
+ goto err;
+ }
+
+ ret = abx500_get_register_interruptible(di->dev, AB8500_GAS_GAUGE,
+ AB8500_GASG_CC_SMPL_CNVH_REG, &high_data);
+ if (ret < 0) {
+ dev_err(di->dev, "read high byte sample conversion failed\n");
+ goto err;
+ }
+
+ di->test.cc_sample_conv = (high_data << 8) | low_data;
+
+ dev_dbg(di->dev, "Sample reading done...\n");
+ mutex_unlock(&di->test.lock);
+
+ return di->test.cc_sample_conv;
+
+err:
+ mutex_unlock(&di->test.lock);
+ dev_err(di->dev, "Sample reading failure\n");
+ return ret;
+}
+
+/**
+ * ab8500_fg_test_sample_calibrate() - compute sample calibrated data
+ * @di: pointer to the ab8500_fg structure
+ * @val: raw sample
+ *
+ * Return sample calibrated value
+ * Only used for test purpose
+ */
+int ab8500_fg_test_sample_calibrate(struct ab8500_fg *di, int val)
+{
+ int ret;
+
+ ret = ab8500_fg_test_get_cc_mux_offset(di);
+ if (ret < 0)
+ return ret;
+
+ if (ret)
+ return val - di->test.cc_int_offset;
+ else
+ return val - di->test.cc_soft_offset;
+}
+
+/**
+ * ab8500_fg_test_sample_calibrate_to_uA() - convert sample calibrated data
+ * to nuAH
+ * @di: pointer to the ab8500_fg structure
+ * @val: calibrate sample
+ *
+ * Return sample calibrated value
+ * Only used for test purpose
+ */
+int ab8500_fg_test_sample_calibrate_to_uA(struct ab8500_fg *di, int val)
+{
+ di->test.cc_sample_conv_calib_uA = val * QLSB_NANO_AMP_HOURS_X10;
+ return di->test.cc_sample_conv_calib_uA;
+}
+
+/**
+ * ab8500_fg_test_get_nconv_accu() - get number of conversion accumulated
+ * @di: pointer to the ab8500_fg structure
+ *
+ * Return umber of conversion accumulated or error code on failure
+ * Only used for test purpose
+ */
+int ab8500_fg_test_get_nconv_accu(struct ab8500_fg *di, u8 *val)
+{
+ int ret;
+
+ ret = abx500_get_register_interruptible(di->dev, AB8500_GAS_GAUGE,
+ AB8500_GASG_CC_NCOV_ACCU, val);
+ if (ret < 0)
+ dev_err(di->dev,
+ "get nb samples to be accumulated failed\n");
+
+ return ret;
+}
+
+/**
+ * ab8500_fg_test_get_nconv_accu_to_uA() - get number of conversion accumulated
+ * in uA
+ * @di: pointer to the ab8500_fg structure
+ *
+ * Return umber of conversion accumulated or error code on failure
+ * Only used for test purpose
+ */
+int ab8500_fg_test_get_nconv_accu_to_uA(struct ab8500_fg *di, int val)
+{
+ return val * di->test.cc_sample_conv_calib_uA;
+}
+
+/**
+ * ab8500_fg_test_set_rst_nconv_accu() - allows to reset the 21bits accumulator data
+ * @di: pointer to the ab8500_fg structure
+ * @enable: enable/disable to reset the 21bits accumulator data
+ *
+ * Return 0 or error code on failure
+ * Only used for test purpose
+ */
+int ab8500_fg_test_set_rst_nconv_accu(struct ab8500_fg *di,
+ bool enable)
+{
+ int ret;
+ u8 val = 0;
+
+ if (enable)
+ val = RESET_ACCU;
+ ret = abx500_mask_and_set_register_interruptible(di->dev,
+ AB8500_GAS_GAUGE, AB8500_GASG_CC_NCOV_ACCU_CTRL,
+ RESET_ACCU, val);
+ if (ret < 0)
+ dev_err(di->dev,
+ "set accumulator reset bit failed\n");
+
+ return ret;
+}
+
+/**
+ * ab8500_fg_test_get_rst_nconv_accu() - get staus of ResetNconvAccu bit
+ * @di: pointer to the ab8500_fg structure
+ *
+ * Return accumulator reset bit or error code on failure
+ * Only used for test purpose
+ */
+int ab8500_fg_test_get_rst_nconv_accu(struct ab8500_fg *di)
+{
+ u8 val = 0;
+ int ret;
+
+ ret = abx500_get_register_interruptible(di->dev, AB8500_GAS_GAUGE,
+ AB8500_GASG_CC_NCOV_ACCU_CTRL, &val);
+ if (ret < 0) {
+ dev_err(di->dev,
+ "get accumulator reset bit failedd\n");
+ goto out;
+ }
+
+ if (val & RESET_ACCU)
+ ret = 1;
+ else
+ ret = 0;
+out:
+ return ret;
+}
+
+/**
+ * ab8500_fg_test_set_nconv_accu_nb_sample() - set number of sample conversion
+ * to be accumulated in 21bits accumulator
+ * @di: pointer to the ab8500_fg structure
+ * @nb_sample: number of samples
+ *
+ * Return 0 or error code on failure
+ * Only used for test purpose
+ */
+int ab8500_fg_test_set_nconv_accu_nb_sample(struct ab8500_fg *di, u8 val)
+{
+ int ret;
+
+ ret = abx500_set_register_interruptible(di->dev,
+ AB8500_GAS_GAUGE, AB8500_GASG_CC_NCOV_ACCU, val);
+ if (ret < 0)
+ dev_err(di->dev,
+ "set number of samples to accumulated failed\n");
+
+ return ret;
+}
+
+/**
+ * ab8500_fg_test_get_nconv_accu_nb_sample() - get number of sample conversion
+ * to be accumulated in 21bits accumulator
+ * @di: pointer to the ab8500_fg structure
+ *
+ * Return number of samples to be accumulated or error code on failure
+ * Only used for test purpose
+ */
+int ab8500_fg_test_get_nconv_accu_nb_sample(struct ab8500_fg *di, u8 *val)
+{
+ int ret;
+
+ ret = abx500_get_register_interruptible(di->dev, AB8500_GAS_GAUGE,
+ AB8500_GASG_CC_NCOV_ACCU, val);
+ if (ret < 0)
+ dev_err(di->dev,
+ "get number of samples to accumulated failed\n");
+
+ return ret;
+}
+
+/**
+ * ab8500_fg_test_read_nconv_accu_sample() - read of accumulator after N samples
+ * @di: pointer to the ab8500_fg structure
+ *
+ * Return sample or error code on failure
+ * Only used for test purpose
+ */
+int ab8500_fg_test_read_nconv_accu_sample(struct ab8500_fg *di)
+{
+ int ret;
+ int nb_sample;
+ u8 low_data, med_data, high_data;
+
+ /* Get nb sample to average */
+ ret = ab8500_fg_test_get_nconv_accu_nb_sample(di, &nb_sample);
+ if (ret < 0)
+ goto out;
+
+ mutex_lock(&di->test.lock);
+ dev_dbg(di->dev, "N Samples reading ongoing...\n");
+
+ /* Launch measure */
+ ret = abx500_mask_and_set_register_interruptible(di->dev,
+ AB8500_GAS_GAUGE, AB8500_GASG_CC_NCOV_ACCU_CTRL,
+ RD_NCONV_ACCU_REQ, RD_NCONV_ACCU_REQ);
+ if (ret < 0) {
+ dev_err(di->dev,
+ "launch measure failed\n");
+ goto err;
+ }
+
+ /* wait for completion of measure */
+ if (!wait_for_completion_timeout(&di->test.nconv_accu_complete,
+ nb_sample*(HZ/4))) {
+ dev_err(di->dev,
+ "timeout: didn't receive NCONV_ACCU interrupt\n");
+ ret = -EINVAL;
+ goto err;
+ }
+
+ /* Retrieve samples */
+ ret = abx500_get_register_interruptible(di->dev, AB8500_GAS_GAUGE,
+ AB8500_GASG_CC_NCOV_ACCU_LOW, &low_data);
+ if (ret < 0) {
+ dev_err(di->dev,
+ "read low data failed\n");
+ goto err;
+ }
+
+ ret = abx500_get_register_interruptible(di->dev, AB8500_GAS_GAUGE,
+ AB8500_GASG_CC_NCOV_ACCU_MED, &med_data);
+ if (ret < 0) {
+ dev_err(di->dev,
+ "read med data failed\n");
+ goto err;
+ }
+
+ ret = abx500_get_register_interruptible(di->dev, AB8500_GAS_GAUGE,
+ AB8500_GASG_CC_NCOV_ACCU_HIGH, &high_data);
+ if (ret < 0) {
+ dev_err(di->dev,
+ "read high data failed\n");
+ goto err;
+ }
+
+ dev_dbg(di->dev, "N Samples reading done...\n");
+ mutex_unlock(&di->test.lock);
+
+ return (high_data << 16) | (med_data << 8) | low_data;
+
+err:
+ mutex_unlock(&di->test.lock);
+ dev_err(di->dev, "Sample reading failure\n");
+out:
+ return ret;
+
+}
+
+/**
+ * ab8500_fg_test_read_nconv_accu_sample_to_uA - convert accu read in uA
+ * @di: pointer to the ab8500_fg structure
+ * @val: accu read
+ *
+ * Return sample or error code on failure
+ * Only used for test purpose
+ */
+int ab8500_fg_test_read_nconv_accu_sample_to_uA(struct ab8500_fg *di, int val)
+{
+ return val * QLSB_NANO_AMP_HOURS_X10;
+}
+
+void __devinit ab8500_fg_test_init(struct ab8500_fg *di)
+{
+ /* Initialize objects need for test purpose. */
+ di->test.enable = false;
+ di->test.cc_int_offset = 0;
+ di->test.cc_soft_offset = 0;
+ di->test.cc_sample_conv = 0;
+ di->test.cc_sample_conv_calib_uA = 0;
+ init_completion(&di->test.cceoc_complete);
+ init_completion(&di->test.nconv_accu_complete);
+ init_completion(&di->test.cc_int_calib_complete);
+ mutex_init(&di->test.lock);
+}
+
@@ -485,4 +485,168 @@ static inline int ab8500_fg_inst_curr_finalize(struct ab8500_fg *di, int *res)
}
#endif
+
+#ifdef CONFIG_AB8500_BM_DEEP_DEBUG
+int ab8500_fg_test_algorithm_en(struct ab8500_fg *di, bool enable);
+bool ab8500_fg_test_is_algorithm_en(struct ab8500_fg *di);
+int ab8500_fg_test_en(struct ab8500_fg *di, bool enable);
+bool ab8500_fg_test_is_en(struct ab8500_fg *di);
+int ab8500_fg_test_set_cc_int_n_avg(struct ab8500_fg *di, u8 val);
+int ab8500_fg_test_get_cc_int_n_avg(struct ab8500_fg *di);
+int ab8500_fg_test_int_calib(struct ab8500_fg *di);
+int ab8500_fg_test_soft_calib(struct ab8500_fg *di);
+int ab8500_fg_test_set_cc_soft_offset(struct ab8500_fg *di, u8 val);
+int ab8500_fg_test_get_cc_soft_offset(struct ab8500_fg *di, u8 *val);
+int ab8500_fg_test_set_rst_accu_sample_counter(struct ab8500_fg *di,
+ bool enable);
+int ab8500_fg_test_get_rst_accu_sample_counter(struct ab8500_fg *di);
+int ab8500_fg_test_set_cc_mux_offset(struct ab8500_fg *di, bool enable);
+int ab8500_fg_test_get_cc_mux_offset(struct ab8500_fg *di);
+int ab8500_fg_test_read_sample(struct ab8500_fg *di);
+int ab8500_fg_test_sample_calibrate(struct ab8500_fg *di, int val);
+int ab8500_fg_test_sample_calibrate_to_uA(struct ab8500_fg *di, int val);
+int ab8500_fg_test_get_nconv_accu(struct ab8500_fg *di, u8 *val);
+int ab8500_fg_test_get_nconv_accu_to_uA(struct ab8500_fg *di, int val);
+int ab8500_fg_test_set_rst_nconv_accu(struct ab8500_fg *di,
+ bool enable);
+int ab8500_fg_test_get_rst_nconv_accu(struct ab8500_fg *di);
+int ab8500_fg_test_set_nconv_accu_nb_sample(struct ab8500_fg *di, u8 val);
+int ab8500_fg_test_get_nconv_accu_nb_sample(struct ab8500_fg *di, u8 *val);
+int ab8500_fg_test_read_nconv_accu_sample(struct ab8500_fg *di);
+int ab8500_fg_test_read_nconv_accu_sample_to_uA(struct ab8500_fg *di, int val);
+#else
+static inline int ab8500_fg_test_algorithm_en(struct ab8500_fg *di, bool enable)
+{
+ return -ENODEV;
+}
+
+static inline bool ab8500_fg_test_is_algorithm_en(struct ab8500_fg *di)
+{
+ return false;
+}
+
+static inline int ab8500_fg_test_en(struct ab8500_fg *di, bool enable)
+{
+ return -ENODEV;
+}
+
+static inline bool ab8500_fg_test_is_en(struct ab8500_fg *di)
+{
+ return false;
+}
+
+static inline int ab8500_fg_test_set_cc_int_n_avg(struct ab8500_fg *di, u8 val)
+{
+ return 0;
+}
+
+static inline int ab8500_fg_test_get_cc_int_n_avg(struct ab8500_fg *di)
+{
+ return 0;
+}
+
+static inline int ab8500_fg_test_int_calib(struct ab8500_fg *di)
+{
+ return -ENODEV;
+}
+
+static inline int ab8500_fg_test_soft_calib(struct ab8500_fg *di)
+{
+ return -ENODEV;
+}
+
+static inline int ab8500_fg_test_set_cc_soft_offset(struct ab8500_fg *di,
+ u8 val)
+{
+ return 0;
+}
+static inline int ab8500_fg_test_get_cc_soft_offset(struct ab8500_fg *di)
+{
+ return 0;
+}
+
+static inline int ab8500_fg_test_set_rst_accu_sample_counter(struct ab8500_fg
+ *di, bool enable)
+{
+ return 0;
+}
+
+static inline int ab8500_fg_test_get_rst_accu_sample_counter(struct ab8500_fg
+ *di)
+{
+ return 0;
+}
+
+static inline int ab8500_fg_test_set_cc_mux_offset(struct ab8500_fg *di,
+ bool enable)
+{
+ return 0;
+}
+
+static inline int ab8500_fg_test_get_cc_mux_offset(struct ab8500_fg *di)
+{
+ return 0;
+}
+
+static inline int ab8500_fg_test_read_sample(struct ab8500_fg *di)
+{
+ return -ENODEV;
+}
+
+static inline int ab8500_fg_test_sample_calibrate(struct ab8500_fg *di, int val)
+{
+ return 0;
+}
+
+static inline int ab8500_fg_test_sample_calibrate_to_uA(struct ab8500_fg *di,
+ int val)
+{
+ return 0;
+}
+
+static inline int ab8500_fg_test_get_nconv_accu(struct ab8500_fg *di)
+{
+ return 0;
+}
+
+static inline int ab8500_fg_test_get_nconv_accu_to_uA(struct ab8500_fg *di,
+ int val)
+{
+ return 0;
+}
+
+static inline int ab8500_fg_test_set_rst_nconv_accu(struct ab8500_fg *di,
+ bool enable)
+{
+ return 0;
+}
+
+static inline int ab8500_fg_test_get_rst_nconv_accu(struct ab8500_fg *di)
+{
+ return 0;
+}
+
+static inline int ab8500_fg_test_set_nconv_accu_nb_sample(struct ab8500_fg *di,
+ u8 val)
+{
+ return 0;
+}
+
+static inline int ab8500_fg_test_get_nconv_accu_nb_sample(struct ab8500_fg *di)
+{
+ return 0;
+}
+
+static inline int ab8500_fg_test_read_nconv_accu_sample(struct ab8500_fg *di)
+{
+ return -ENODEV;
+}
+
+static inline int ab8500_fg_test_read_nconv_accu_sample_to_uA(struct ab8500_fg
+ *di, int val)
+{
+ return 0;
+}
+
+#endif
#endif /* _AB8500_BM_H */